4. Semiconductor device manufacturing: process
  5. Making field effect device having pair of active regions...
  6. Having insulated gate

Bo-Ching Jiang

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Device and method for detecting alignment of deep trench...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method of forming source/drain regions in semiconductor devices

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Misalignment test structure and method thereof

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Reexamination Certificate

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Misalignment test structure and method thereof

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Test key and method for validating the doping concentration...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2697242

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