4. Computer-aided design and analysis of circuits and semiconductor
  5. Design of semiconductor mask or reticle
  6. Layout generation

Bernhard R. Liegl

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Density-aware dynamic leveling in scanning exposure systems

Photocopying – Projection printing and copying cameras – Focus or magnification control
Reexamination Certificate

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Proximity sensitive defect monitor

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
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System and method of predicting problematic areas for...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Layout generation
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2408660

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