4. Measuring and testing
  5. Sampler, sample handling, etc.
  6. Capture device

Baik-soon Choi

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Apparatus and method for particle sampling during semiconductor

Measuring and testing – Sampler – sample handling – etc. – Capture device
Patent

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Chemical vapor deposition apparatus for manufacturing...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of...
Reexamination Certificate

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Chemical vapor deposition apparatus for manufacturing...

Coating apparatus – Gas or vapor deposition
Reexamination Certificate

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Chemical vapor deposition method for manufacturing...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Composition for removing a photoresist and method of...

Cleaning compositions for solid surfaces – auxiliary compositions – Cleaning compositions or processes of preparing – For cleaning a specific substrate or removing a specific...
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1206408

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