4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Asia Electronics Inc.

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Apparatus for testing semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Memory analyzing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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TFT array inspection method and device

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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