4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Arndt Gruber

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Integrated circuit, test structure and method for testing...

Static information storage and retrieval – Read/write circuit – Testing
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Integrated memory and method of repairing an integrated memory

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Integrated semiconductor memory and method for operating an...

Static information storage and retrieval – Addressing – Particular decoder or driver circuit
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Integrated semiconductor memory with redundant memory cells...

Static information storage and retrieval – Read/write circuit – Bad bit
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Profile ID: LFUS-PAI-P-2591960

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