4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Andrey Nikitin

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Memory generation and placement

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for mapping design memories to...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing
Reexamination Certificate

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Method and apparatus for mapping design memories to...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for mapping design memories to...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for tiling memories in integrated...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2365253

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