4. Optics: measuring and testing
  5. By configuration comparison
  6. With photosensitive film or plate

Andrew Perry

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Method and apparatus for in-situ monitoring of plasma etch and d

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for in-situ monitoring of plasma etch...

Optics: measuring and testing – Dimension – Thickness
Reissue Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

System and method for integrated multi-use optical alignment

Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Andrew Perry does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Andrew Perry, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Andrew Perry will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-401564

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure