4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Distributive type parameters

Andreas Logisch

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Circuit arrangement and method for driving electronic chips

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Circuit arrangement and method for driving electronic chips

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Insertable calibration device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method and magazine device for testing semiconductor devices

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Test apparatus for testing devices under test and method for...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2711515

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