4. Electricity: measuring and testing
  5. A material property using electrostatic phenomenon
  6. For flaw detection

Alfred J. Griffin, Jr.

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Electrostatic adhesion tester for thin film conductors

Electricity: measuring and testing – A material property using electrostatic phenomenon – For flaw detection
Patent

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Method for forming a metal extrusion free via

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Method for forming a void free via

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Method for forming a void free via

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Systems and methods for removing wafer edge residue and...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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