4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Alexander W. Schaefer

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Apparatus for testing embedded memory read paths

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Memory array with global bitline domino read/write scheme

Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate

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Memory array with global bitline domino read/write scheme

Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2291807

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