4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Alan Hales

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IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

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