4. Optics: measuring and testing
  5. By polarized light examination

Akira Kazama

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Ellipsometer and method of controlling coating thickness therewi

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Manufacturing method and equipment of single silicon crystal

Chemical apparatus and process disinfecting – deodorizing – preser – Chemical reactor – Including specific material of construction
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Manufacturing method and equipment of single silicon crystal

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step
Patent

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Measuring method for ellipsometric parameter and ellipsometer

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Measuring method for ellipsometric parameter and ellipsometer

Optics: measuring and testing – By polarized light examination
Patent

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Profile ID: LFUS-PAI-P-154080

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