4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Field effect device
  6. Having insulated electrode

Akihiko Teshigahara

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Angular rate sensor

Measuring and testing – Speed – velocity – or acceleration – Angular rate using wave or beam motion
Reexamination Certificate

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Capacitance type physical quantity sensor

Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Reexamination Certificate

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Flow sensor having thin film portion and method for...

Measuring and testing – Volume or rate of flow – Thermal type
Reexamination Certificate

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Radar apparatus

Optics: measuring and testing – Range or remote distance finding – With photodetection
Reexamination Certificate

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Semiconductor apparatus having high withstand voltage

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Patent

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Profile ID: LFUS-PAI-P-1349739

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