Fault simulation apparatus

Details Fault simulation apparatus Fault simulation apparatus

1997-04-21

1999-08-03

Tu, Trinh L.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

714724, 395500, G01R 3128, G06F 300

Patent

active

059319631

ABSTRACT:
A fault simulation apparatus includes an MOS transistor output signal strength determining portion for extracting the conductivity type of an MOS transistor in which an event such as a variation in signal level occurs. A control signal value is obtained from a control terminal, and an input signal value is obtained from an input terminal, and output signal strength when the event occurring MOS transistor is turned ON is determined. In the apparatus, fault simulation is performed depending upon the output signal strength determined by the output signal strength determining portion.

REFERENCES:
patent: 5345401 (1994-09-01), Tani
patent: 5701254 (1997-12-01), Tani
patent: 5719881 (1998-02-01), Yonetoku

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