Method of manufacturing devices having vertical junction edge

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S241000, C438S242000, C438S243000

Reexamination Certificate

active

08084322

ABSTRACT:
Techniques for forming devices, such as transistors, having vertical junction edges. More specifically, shallow trenches are formed in a substrate and filled with an oxide. Cavities may be formed in the oxide and filled with a conductive material, such a doped polysilicon. Vertical junctions are formed between the polysilicon and the exposed substrate at the trench edges such that during a thermal cycle, the doped polysilicon will out-diffuse doping elements into the adjacent single crystal silicon advantageously forming a diode extension having desirable properties.

REFERENCES:
patent: 5554553 (1996-09-01), Harari
patent: 5841150 (1998-11-01), Gonzalez et al.
patent: 6087706 (2000-07-01), Dawson et al.
patent: 6096596 (2000-08-01), Gonzalez
patent: 6118135 (2000-09-01), Gonzalez et al.
patent: 6271566 (2001-08-01), Tsuchiaki
patent: 6344388 (2002-02-01), Oishi et al.
patent: 6429104 (2002-08-01), Auberton-Herve
patent: 6445044 (2002-09-01), Manning
patent: 6452246 (2002-09-01), Komori
patent: 6468879 (2002-10-01), Lamure et al.
patent: 6593624 (2003-07-01), Walker
patent: 6703274 (2004-03-01), Chidambarrao et al.
patent: 6940145 (2005-09-01), Blair et al.
patent: 6955957 (2005-10-01), Shin
patent: 2002/0064912 (2002-05-01), Komori
patent: 2002/0190344 (2002-12-01), Michejda et al.
patent: 2003/0022450 (2003-01-01), Pan et al.
patent: 2003/0025125 (2003-02-01), Menut et al.
patent: 2004/0070023 (2004-04-01), Kim et al.
patent: 2004/0126986 (2004-07-01), Wise et al.
patent: 2004/0201059 (2004-10-01), Ding
patent: 2006/0163631 (2006-07-01), Chen et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing devices having vertical junction edge does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing devices having vertical junction edge, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing devices having vertical junction edge will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4312714

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.