Compound semiconductor structure

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C257S076000, C257S194000, C257SE29246, C257SE21403

Reexamination Certificate

active

08030164

ABSTRACT:
A method for manufacturing a compound semiconductor structure, includes (a) selecting a conductive SiC substrate in accordance with color and resistivity and (b) epitaxially growing a GaN series compound semiconductor layer on the selected conductive SiC substrate. The step (a) preferably selects a conductive SiC substrate whose main color is green, whose conductivity type is n-type and whose resistivity is 0.08 Ωcm to 1×105Ωcm, or whose main color is black, whose conductivity type is p-type and whose resistivity is 1×103Ωcm to 1×105Ωcm, or whose main color is blue, whose conductivity type is p-type and whose resistivity is 10 Ωcm to 1×105Ωcm. The step (b) preferably includes (b-1) growing an AlInGaN layer having a thickness not thinner than 10 μm on the conductive SiC substrate by hydride VPE.

REFERENCES:
patent: 6610551 (2003-08-01), Doverspike et al.
patent: 2002/0110945 (2002-08-01), Kuramata et al.
patent: 2004/0144991 (2004-07-01), Kikkawa et al.
patent: 2005/0274980 (2005-12-01), Miyoshi
patent: 2007/0164321 (2007-07-01), Sheppard et al.
patent: 2000-040858 (2000-02-01), None
patent: 2002-527890 (2002-08-01), None
patent: 2002-359256 (2002-12-01), None
patent: 2004-221325 (2004-08-01), None
patent: 00/21144 (2000-04-01), None
Gary Lyn Harris, Properties of Silicon Carbide, 1995, IET, pp. 19, 170-180.
Gary L Harris, Properties of Silicon Carbide, 1995,INSPEC, vol. 13, pp. 19 and 170-180, isbn:0852968701.
M. Kanamura et al. “A 100-W High-Gain AIGaN/GaN HEMT Power Amplifier on a Conductive N-SiC Substrate for Wireless Base Station Applications,” Electron Devices Meeting; 2004; IEDM Technical Digest; IEEE International Dec. 13-15, 2004; pp. 799-802.
“[Press Release] Fujitsu Develops Breakthrough Technology for Low-Cost Production of Gallium-Nitride HEMT;” [online]; Dec. 21, 2004; Fujitsu Laboratories Ltd., retrieval date Jun. 26, 2006.
International Search Report of PCT/JP2006/307566, date of mailing Jul. 4, 2006.

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