Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate
2008-07-22
2010-06-29
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Having fuse element
C365S052000
Reexamination Certificate
active
07746719
ABSTRACT:
Disclosed is a multi-chip package having a plurality of memory chips. Each memory chip includes a memory cell array storing e-fuse data, a read-out control circuit reading e-fuse data in response to a read signal, a first internal pad receiving a first control signal, a read-out controller generating the read signal to define a read period, and to generate a second control signal following the read period, and a second internal pad receiving the second control signal, wherein the plurality of memory chips is connected series and each respective read-out control circuit and read-out controller in each one of the plurality of memory chips cooperate to implement a sequential read of e-fuse data across the plurality of memory chips.
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Phung Anh
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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