Compressing test responses using a compactor

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S732000, C714S729000

Reexamination Certificate

active

07743302

ABSTRACT:
The present disclosure describes embodiments of a compactor for compressing test results in an integrated circuit and methods for using and designing such embodiments. The disclosed compactors can be utilized, for example, as part of any scan-based design. Moreover, any of the disclosed compactors can be designed, simulated, and/or verified in a computer-executed application, such as an electronic-design-automation (“EDA”) software tool. Embodiments of a method for diagnosing faults in the disclosed compactor embodiments are also described.

REFERENCES:
patent: 4161041 (1979-07-01), Butler et al.
patent: 4320509 (1982-03-01), Davidson
patent: 4503537 (1985-03-01), McAnney
patent: 4513418 (1985-04-01), Bardell, Jr. et al.
patent: 4536881 (1985-08-01), Kasuya
patent: 4602210 (1986-07-01), Fasang et al.
patent: 4687988 (1987-08-01), Eichelberger et al.
patent: 4754215 (1988-06-01), Kawai
patent: 4801870 (1989-01-01), Eichelberger et al.
patent: 5072178 (1991-12-01), Matsumoto
patent: 5090035 (1992-02-01), Murase
patent: 5091908 (1992-02-01), Zorian
patent: 5138619 (1992-08-01), Fasang et al.
patent: 5167034 (1992-11-01), MacLean, Jr. et al.
patent: 5173906 (1992-12-01), Dreibelbis et al.
patent: 5258986 (1993-11-01), Zerbe
patent: 5301199 (1994-04-01), Ikenaga et al.
patent: 5369648 (1994-11-01), Nelson
patent: 5412665 (1995-05-01), Gruodis et al.
patent: 5416783 (1995-05-01), Broseghini et al.
patent: 5450414 (1995-09-01), Lin
patent: 5533035 (1996-07-01), Saxena et al.
patent: 5533128 (1996-07-01), Vobach
patent: 5574733 (1996-11-01), Kim
patent: 5608870 (1997-03-01), Valiant
patent: 5612729 (1997-03-01), Ellis et al.
patent: 5631913 (1997-05-01), Maeda
patent: 5642362 (1997-06-01), Savir
patent: 5680543 (1997-10-01), Bhawmik
patent: 5694402 (1997-12-01), Butler et al.
patent: 5701308 (1997-12-01), Attaway et al.
patent: 5717701 (1998-02-01), Angelotti et al.
patent: 5790562 (1998-08-01), Murray et al.
patent: 5831992 (1998-11-01), Wu
patent: 5848198 (1998-12-01), Penn
patent: 5867507 (1999-02-01), Beebe et al.
patent: 5883906 (1999-03-01), Turnquist et al.
patent: 5899961 (1999-05-01), Sundermann
patent: 5905986 (1999-05-01), Rohrbaugh et al.
patent: 5938784 (1999-08-01), Kim
patent: 5991898 (1999-11-01), Rajski et al.
patent: 5991909 (1999-11-01), Rajski et al.
patent: 6026508 (2000-02-01), Craft
patent: 6181164 (2001-01-01), Miller
patent: 6272653 (2001-08-01), Amstutz
patent: 6300885 (2001-10-01), Davenport et al.
patent: 6308291 (2001-10-01), Kock et al.
patent: 6327687 (2001-12-01), Rajski et al.
patent: 6353842 (2002-03-01), Rajski et al.
patent: 6425104 (2002-07-01), Toumiya
patent: 6467058 (2002-10-01), Chakradhar et al.
patent: 6539409 (2003-03-01), Rajski et al.
patent: 6543020 (2003-04-01), Rajski et al.
patent: 6557129 (2003-04-01), Rajski et al.
patent: 6590929 (2003-07-01), Williams
patent: 6668347 (2003-12-01), Babella et al.
patent: 6671839 (2003-12-01), Cote et al.
patent: 6684358 (2004-01-01), Rajski et al.
patent: 6708192 (2004-03-01), Rajski et al.
patent: 6763488 (2004-07-01), Whetsel
patent: 6829740 (2004-12-01), Rajski et al.
patent: 6874109 (2005-03-01), Rajski et al.
patent: 6993694 (2006-01-01), Kapur et al.
patent: 7032148 (2006-04-01), Wang et al.
patent: 7058869 (2006-06-01), Abdel-Hafez et al.
patent: 7093175 (2006-08-01), Rajski et al.
patent: 7111209 (2006-09-01), Rajski et al.
patent: 7302624 (2007-11-01), Rajski et al.
patent: 7370254 (2008-05-01), Rajski et al.
patent: 2002/0099992 (2002-07-01), Distler et al.
patent: 2002/0112199 (2002-08-01), Whetsel
patent: 2002/0124217 (2002-09-01), Hiraide et al.
patent: 2003/0120988 (2003-06-01), Rajski et al.
patent: 2003/0131298 (2003-07-01), Rajski et al.
patent: 2003/0188269 (2003-10-01), Mitra et al.
patent: 2004/0128599 (2004-07-01), Rajski et al.
patent: 2004/0172431 (2004-09-01), Rajski et al.
patent: 2004/0230884 (2004-11-01), Rajski et al.
patent: 2005/0015688 (2005-01-01), Rajski et al.
patent: 2005/0055613 (2005-03-01), Mitra et al.
patent: 2005/0097419 (2005-05-01), Rajski et al.
patent: 2007/0011530 (2007-01-01), Rajski et al.
patent: 2007/0016836 (2007-01-01), Rajski et al.
patent: 0438322 (1991-07-01), None
patent: 0 549 949 (1998-03-01), None
patent: 1978446 (2008-10-01), None
patent: 63-286780 (1988-11-01), None
patent: 01-239486 (1989-09-01), None
patent: 03-002579 (1991-01-01), None
patent: 03-012573 (1991-01-01), None
patent: 05-215816 (1993-08-01), None
patent: 05-249197 (1993-09-01), None
patent: 07-174822 (1994-07-01), None
patent: 08-015382 (1996-01-01), None
patent: 11-030646 (1999-02-01), None
patent: 11-264860 (1999-09-01), None
patent: WO 91/10182 (1991-07-01), None
patent: WO 01/38889 (2001-05-01), None
patent: WO 01/39254 (2001-05-01), None
“An a priori approach to the evaluation of signature analysis efficiency” by Caspi et al. This paper appears in: Computers, IEEE Transactions on Publication Date: Sep. 1991 vol. 40, Issue 9 On pp. 1068-1071 ISSN: 0018-9340 INSPEC Accession No. 4026485.
“Simultaneous signature and syndrome compression” by Robinson et al. This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Publication Date: May 1988 vol. 7, Issue: 5 On pp. 584-589 ISSN: 0278-0070 INSPEC Accession No. 3188236.
“Aliasing probabilities for feedback signature compression of test data” by Robinson This paper appears in: Computers, IEEE Transactions on Publication Date: Jul. 1991 vol. 40, Issue: 7 On pp. 867-873 ISSN: 0018-9340 INSPEC Accession No. 4034085.
U.S. Appl. No. 09/620,021, filed Jul. 20, 2000, Rajski et al.
Aldrich et al., “Improving Test Quality and Reducing Escapes,”Fabless Forum Magazine, vol. 10, No. 1, 2 pp. (2003).
Aitken et al., “A Diagnosis Method Using Pseudo-Random Vectors Without Intermediate Signatures,”Proc. ICCAD, pp. 574-577 (1989).
Bardell, “Design Considerations for Parallel Pseudorandom Pattern Generators,”Journal of Electronic Testing: Theory and Applications, 1, 73-87 (1990).
Bardell et al.,Built-In Test for VLSI Pseudorandom Techniques, Chapter 4, “Test Response Compression Techniques,” John Wiley & Sons, Inc., pp. 89-108 (1987).
Barnhart et al., “Extending OPMISR beyond 10x Scan Test Efficiency,”IEEE Design and Test, vol. 19, No. 5, pp. 65-73 (Sep. 2002).
Bayraktaroglu et al., “Deterministic Partitioning Techniques for Fault Diagnosis in Scan-Based BIST,”Proc. ITC, pp. 273-282 (2000).
Bayraktaroglu et al., “Diagnosis for Scan Based BIST: Reaching Deep into the Signatures,”Proc. Design Automation and Test in Europe, pp. 102-109 (2001).
Benowitz et al., “An Advanced Fault Isolation System for Digital Logic,”IEEE Transactions on Computers, vol. 24, No. 5, pp. 489-497 (1975).
Benware et al., “Impact of Multiple-Detect Test Patterns on Product Quality,”Proc. ITC, pp. 1031-1040 (Sep. 2003).
Bhattacharya et al., “Synthesis of Single-Output Space Compactors for Scan-Based Sequential Circuits,”IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 21, No. 10, pp. 1171-1179 (Oct. 2002).
Chakrabarty et al., “Optimal Space Compaction of Test Responses,”Proc. ITC, pp. 834-843 (1995).
Chakrabarty et al., “Optimal Zero-Aliasing Space Compaction of Test Responses,”IEEE Transactions on Computers, vol. 47, No. 11, pp. 1171-1187 (Nov. 1998).
Chakrabarty et al., “Test Response Compaction Using Multiplexed Parity Trees,”IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 15, No. 11, pp. 1399-1408 (Nov. 1996).
Chakrabarty, “Zero-Aliasing Space Compaction Using Linear Compactors With Bounded Overhead,”IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 17, No. 5, pp. 452-457 (May 1998).
Chan et al., “A Study of Faulty Signature for Diagnostics,”Proc. ISCAS, pp. 2701-2704 (1990).
Chan et al., “A Study of Faulty Signatures Using a Matrix Formulation,”

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Compressing test responses using a compactor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Compressing test responses using a compactor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compressing test responses using a compactor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4239276

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.