Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-04-17
2010-12-14
Tabone, Jr., John J (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S731000, C714S742000, C714S817000, C714S025000
Reexamination Certificate
active
07853844
ABSTRACT:
A semiconductor integrated circuit system has a control target circuit executing a program, a system information monitor unit for outputting system information indicating a state of the control target circuit, a circuit characteristic monitor unit for determining a circuit characteristic of the control target circuit and outputting the circuit characteristic as circuit characteristic information, a malfunction determination unit for determining whether or not the control target circuit is normally operating based on the system information, a reference circuit characteristic holding unit for holding the circuit characteristic information as reference circuit characteristic information when the control target circuit is normally operating, a malfunction factor determination unit for determining a malfunction factor based on the circuit characteristic information and on the reference circuit characteristic information when the control target circuit is not normally operating, and a correction target determination unit for determining a correction target in the control target circuit.
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McDermott Will & Emery LLP
Panasonic Corporation
Tabone, Jr. John J
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