Method of manufacturing a variable resistance structure and...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S003000, C438S634000, C438S669000, C438S675000, C257SE21305

Reexamination Certificate

active

07666789

ABSTRACT:
In methods of manufacturing a variable resistance structure and a phase-change memory device, after forming a first insulation layer on a substrate having a contact region, a contact hole exposing the contact region is formed through the first insulation layer. After forming a first conductive layer on the first insulation layer to fill up the contact hole, a first protection layer pattern is formed on the first conductive layer. The first conductive layer is partially etched to form a contact and to form a pad on the contact. A second protection layer is formed on the first protection layer pattern, and then an opening exposing the pad is formed through the second protection layer and the first protection layer pattern. After formation of a first electrode, a phase-change material layer pattern and a second electrode are formed on the first electrode and the second protection layer.

REFERENCES:
patent: 6706554 (2004-03-01), Ogura
patent: 6797612 (2004-09-01), Zahorik
patent: 2002/0025372 (2002-02-01), Leiphart
patent: 2004/0048460 (2004-03-01), Asahina et al.
patent: 2004/0238957 (2004-12-01), Akram et al.
patent: 2005/0130414 (2005-06-01), Choi et al.
patent: 2008/0280411 (2008-11-01), Chang
patent: 2003-86820 (2003-11-01), None
patent: 2005-0001169 (2005-01-01), None
patent: 2005-0031160 (2005-04-01), None
patent: 2005-0033340 (2005-04-01), None
patent: 10-2005-0071965 (2005-07-01), None
English language abstract of Korean Publication No. 2003-86820.
English language abstract of Korean Publication No. 2005-0001169.
English language abstract of Korean Publication No. 2005-0031160.
English language abstract of Korean Publication No. 2005-0033340.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing a variable resistance structure and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing a variable resistance structure and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing a variable resistance structure and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4216061

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.