Semiconductor device and manufacturing method of the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C257S288000, C257S310000, C257SE29127

Reexamination Certificate

active

07820503

ABSTRACT:
An object of the present invention is to simplify manufacturing process of an n channel MIS transistor and a p channel MIS transistor with gate electrodes formed of a metal material. For its achievement, gate electrodes of each of the n channel MIS transistor and the p channel MIS transistor are simultaneously formed by patterning ruthenium film deposited on a gate insulator. Next, by introducing oxygen into each of the gate electrodes, the gate electrodes are transformed into those having high work function. Thereafter, by selectively reducing the gate electrode of the n channel MIS transistor, it is transformed into a gate electrode having low work function.

REFERENCES:
patent: 6891233 (2005-05-01), Lin et al.
patent: 2004/0080001 (2004-04-01), Takeuchi
patent: 2000-252370 (1999-03-01), None
patent: 2004-165346 (2002-11-01), None
patent: 2004-165555 (2002-11-01), None
Cartier, E. et al, “Role of Oxygen Vacancies in VFB/Vtstability of pFET metals on HfO2”, 2005 Symposium on VLSI Technology Digest of Technical Papers, IBM Semiconductor Research and Development Center (SRDC), Research Division, T.J. Watson Research Center, IBM Systems and Technology Division, pp. 230-231.

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