Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-10-18
2010-11-23
Carter, Aaron W (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C716S030000
Reexamination Certificate
active
07840057
ABSTRACT:
Methods, and program storage devices, for performing model-based optical proximity correction by providing a region of interest (ROI) having an interaction distance and locating at least one polygon within the ROI. A cut line of sample points representative of a set of vertices, or plurality of cut lines, are generated within the ROI across at least one lateral edge of the polygon(s). An angular position, and first and second portions of the cut line residing on opposing sides of an intersection between the cut line and the lateral edge of the polygon are determined, followed by generating a new ROI by extending the original ROI beyond its interaction distance based on such angular position, and first and second portions of the cut line. In this manner, a variety of new ROIs may be generated, in a variety of different directions, to ultimately correct for optical proximity.
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Gallatin Gregg M.
Gofman Emanuel
Lai Kafai
Lavin Mark A.
Mukherjee Maharaj
Brown Katherine S.
Carter Aaron W
DeLio & Peterson LLC
International Business Machines - Corporation
Nowak Kelly M.
LandOfFree
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