Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-02-23
2010-06-08
Nguyen, Kimberly D (Department: 2894)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S421000, C257SE23013, C257SE21573
Reexamination Certificate
active
07732322
ABSTRACT:
In a first aspect, a first method of manufacturing a dielectric material with a reduced dielectric constant is provided. The first method includes the steps of (1) forming a dielectric material layer including a trench on a substrate; and (2) forming a cladding region in the dielectric material layer by forming a plurality of air gaps in the dielectric material layer along at least one of a sidewall and a bottom of the trench so as to reduce an effective dielectric constant of the dielectric material. Numerous other aspects are provided.
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Hsu Louis Lu-Chen
Mandelman Jack Allan
Yang Chih-Chao
Dugan & Dugan PC
International Business Machines - Corporation
Nguyen Kimberly D
Tran Tony
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