Dielectric material with reduced dielectric constant and...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S421000, C257SE23013, C257SE21573

Reexamination Certificate

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07732322

ABSTRACT:
In a first aspect, a first method of manufacturing a dielectric material with a reduced dielectric constant is provided. The first method includes the steps of (1) forming a dielectric material layer including a trench on a substrate; and (2) forming a cladding region in the dielectric material layer by forming a plurality of air gaps in the dielectric material layer along at least one of a sidewall and a bottom of the trench so as to reduce an effective dielectric constant of the dielectric material. Numerous other aspects are provided.

REFERENCES:
patent: 6090698 (2000-07-01), Lee
patent: 6204192 (2001-03-01), Zhao et al.
patent: 6610593 (2003-08-01), Kohl et al.
patent: 6835631 (2004-12-01), Zhen et al.
patent: 6861332 (2005-03-01), Park et al.
patent: 6903002 (2005-06-01), Ben-Tzur et al.
patent: 2003/0109122 (2003-06-01), Gross
patent: 2004/0115910 (2004-06-01), Passemard et al.
patent: 2006/0030128 (2006-02-01), Bu et al.
patent: 2007/0173073 (2007-07-01), Weber
patent: WO 02058134 (2002-07-01), None

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