Method for nitriding substrate and method for forming...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate

Reexamination Certificate

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C257SE21292, C118S7230AN

Reexamination Certificate

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07820557

ABSTRACT:
In a substrate nitriding method for nitriding a target substrate by allowing a nitrogen-containing plasma to act on silicon on a surface of the substrate in a processing chamber of a plasma processing apparatus, the nitridation by the nitrogen-containing plasma is performed by controlling a sheath voltage Vdcaround the substrate to be less than or equal to about 3.5 eV. The sheath voltage Vdcis a potential difference Vp−Vfbetween a plasma potential Vpin a plasma generating region and a floating potential Vfof the substrate.

REFERENCES:
patent: 7159599 (2007-01-01), Verhaverbeke et al.
patent: 2003/0082835 (2003-05-01), McChesney et al.
patent: 2004/0121539 (2004-06-01), Omi et al.
patent: 2004/0134618 (2004-07-01), Endoh et al.
patent: 2004/0142577 (2004-07-01), Sugawara et al.
patent: 2005/0205013 (2005-09-01), Nakanishi et al.
patent: 2008/0214017 (2008-09-01), Murakawa et al.
patent: 02 058130 (2002-07-01), None
patent: 2004 047157 (2004-06-01), None
patent: WO 2004047157 (2004-06-01), None

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