Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate
Reexamination Certificate
2006-03-28
2010-10-26
Coleman, W. David (Department: 2823)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
By reaction with substrate
C257SE21292, C118S7230AN
Reexamination Certificate
active
07820557
ABSTRACT:
In a substrate nitriding method for nitriding a target substrate by allowing a nitrogen-containing plasma to act on silicon on a surface of the substrate in a processing chamber of a plasma processing apparatus, the nitridation by the nitrogen-containing plasma is performed by controlling a sheath voltage Vdcaround the substrate to be less than or equal to about 3.5 eV. The sheath voltage Vdcis a potential difference Vp−Vfbetween a plasma potential Vpin a plasma generating region and a floating potential Vfof the substrate.
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Honda Minoru
Nakanishi Toshio
Coleman W. David
Enad Christine
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Tokyo Electron Limited
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