Method of forming CMOS with Si:C source/drain by laser...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C257S204000, C257SE21454, C257SE21619

Reexamination Certificate

active

07598147

ABSTRACT:
A method of forming crystalline Si:C in source and drain regions is provided. After formation of shallow trench isolation and gate electrodes of field effect transistors, gate spacers are formed on gate electrodes. Preamorphization implantation is performed in the source and drain regions, followed by carbon implantation. The upper portion of the source and drain regions comprises an amorphous mixture of silicon, germanium, and/or carbon. An anti-reflective layer is deposited to enhance the absorption of a laser beam into the silicon substrate. The laser beam is scanned over the silicon substrate including the upper source and drain region with the amorphous mixture. The energy of the laser beam is controlled so that the temperature of the semiconductor substrate is above the melting temperature of the amorphous mixture but below the glass transition temperature of silicon oxide so that structural integrity of the semiconductor structure is preserved.

REFERENCES:
patent: 2007/0269951 (2007-11-01), Lu et al.
patent: 2008/0160683 (2008-07-01), Vanderpool et al.
Ang, K.W., et al., “Enhanced Performance in 50 nm N-MOSFETs with Silicon-Carbon Source/Drain Regions”, IEDM Tech Dig., pp. 1069-1071, 2004.

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