Method and apparatus for an embedded time domain...

Details Method and apparatus for an embedded time domain... Method and apparatus for an embedded time domain...

2004-11-23

2009-12-29

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07640468

ABSTRACT:
A method and apparatus for testing an integrated circuit interconnect comprises an IC having circuitry embedded in the IC capable of providing a pseudo time domain reflectometry test by launching a test transition onto the interconnect and capturing a reflection of the test transition.

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