Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate
2007-04-04
2009-02-03
Lefkowitz, Edward (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
C257S024000
Reexamination Certificate
active
07484423
ABSTRACT:
A method and structure for an integrated circuit comprising a first transistor and an embedded carbon nanotube field effect transistor (CNT FET) proximate to the first transistor, wherein the CNT FET is dimensioned smaller than the first transistor. The CNT FET is adapted to sense signals from the first transistor, wherein the signals comprise any of temperature, voltage, current, electric field, and magnetic field signals. Moreover, the CNT FET is adapted to measure stress and strain in the integrated circuit, wherein the stress and strain comprise any of mechanical and thermal stress and strain. Additionally, the CNT FET is adapted to detect defective circuits within the integrated circuit.
REFERENCES:
patent: 5383194 (1995-01-01), Sloan et al.
patent: 6043662 (2000-03-01), Alers et al.
patent: 6043689 (2000-03-01), Sheets, II et al.
patent: 6437329 (2002-08-01), Yedur et al.
patent: 6630772 (2003-10-01), Bower et al.
patent: 6777960 (2004-08-01), Unger
patent: 6848320 (2005-02-01), Miyajima et al.
patent: 6852582 (2005-02-01), Wei et al.
patent: 6982903 (2006-01-01), Bertin et al.
patent: 7105851 (2006-09-01), Dubin
patent: 7186380 (2007-03-01), Chen et al.
patent: 7256063 (2007-08-01), Pinkerton et al.
patent: 7312096 (2007-12-01), Kurtz
patent: 2001/0023986 (2001-09-01), Mancevski
patent: 2003/0142679 (2003-07-01), Okagawa et al.
patent: 2003/0218224 (2003-11-01), Schlaf et al.
patent: 2006/0054922 (2006-03-01), Pettit
patent: 2003-142679 (2003-05-01), None
patent: WO 02/31183 (2002-04-01), None
Hepp et al., “Light-Emitting Field-Effect Transistor Bases on a Tetracene Thin Film”, The American Physical Society, Physical Review Letters, vol. 91, No. 15, Oct. 10, 2003.
Hakey Mark C.
Masters Mark E.
Pastel Leah M. P.
Vallett David P.
Davis Octavia
Gibb & Rahman, LLC
International Business Machines - Corporation
Lefkowitz Edward
LeStrange, Esq. Michael
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