4. Semiconductor device manufacturing: process
  5. Coating with electrically or thermally conductive material
  6. To form ohmic contact to semiconductive material

Mark E. Masters

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Canary device for failure analysis

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Integrated carbon nanotube sensors

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Heterojunction
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Integrated carbon nanotube sensors

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
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Integrated circuit wiring

Electricity: conductors and insulators – Conduits – cables or conductors – Preformed panel circuit arrangement
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Method of designing and structure for visual and electrical...

Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular signal path connections
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Profile ID: LFUS-PAI-P-2015917

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