Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-09-29
2009-10-13
Nguyen, Khiem D (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S270000, C438S424000, C257SE21545, C257SE21561
Reexamination Certificate
active
07601582
ABSTRACT:
A method for manufacturing a semiconductor device includes forming a semiconductor substrate to have a SOI structure by an epitaxial process for forming a gate while forming an insulating film pattern in a bottom where a device isolation trench is formed. The method thereby increases the process margin for forming a device isolation film and prevents the punch-through phenomenon to improve electrical characteristics of semiconductor devices and increase product yield.
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patent: 7217623 (2007-05-01), Kim et al.
patent: 2002/0137271 (2002-09-01), Forbes et al.
patent: 2005/0227435 (2005-10-01), Oh et al.
patent: 2007/0173005 (2007-07-01), Lee
patent: 1020000027402 (2000-05-01), None
Hynix / Semiconductor Inc.
Nguyen Khiem D
Townsend and Townsend / and Crew LLP
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