Method of creating contour structures to highlight...

Metal working – Method of mechanical manufacture – Electrical device making

Reexamination Certificate

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C029S846000, C029S874000, C257S786000, C324S765010

Reexamination Certificate

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07614147

ABSTRACT:
An integrated circuit has a wiring layer below an insulator layer. A pad comprises a conductive material that is on the insulator layer. The pad has a wirebond connection region and a probe pad region. An inspection mark is between the wirebond connection region and the probe pad region. The inspection mark comprises an opening in the insulator layer that is filled with the conductive material. In addition, a contact that is through the insulator layer is adapted to electrically connect the conductor wire in the wiring layer to the pad. The contact is formed of the same conductive material used for the pad and the inspection mark.

REFERENCES:
patent: 5053357 (1991-10-01), Lin et al.
patent: 5053850 (1991-10-01), Baker et al.
patent: 5153507 (1992-10-01), Fong et al.
patent: 5554940 (1996-09-01), Hubacher
patent: 5831836 (1998-11-01), Long et al.
patent: 5886414 (1999-03-01), Galloway
patent: 5900643 (1999-05-01), Preslar et al.
patent: 6011299 (2000-01-01), Brench
patent: 6083822 (2000-07-01), Lee
patent: 6093630 (2000-07-01), Geffken et al.
patent: 6297561 (2001-10-01), Liu et al.
patent: 6359328 (2002-03-01), Dubin
patent: 6534853 (2003-03-01), Liu et al.
patent: 6605526 (2003-08-01), Howell et al.
patent: 6713881 (2004-03-01), Umehara et al.
patent: 6765228 (2004-07-01), Lin et al.
patent: 2003/0197289 (2003-10-01), Lin

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