Semiconductor device and method of manufacturing the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S585000, C438S592000, C438S630000, C438S657000, C257S406000

Reexamination Certificate

active

07579231

ABSTRACT:
Disclosed is a method of manufacturing a semiconductor device, comprising forming a metal compound film directly or indirectly on a semiconductor substrate, forming a metal-containing insulating film consisting of a metal oxide film or a metal silicate film by oxidizing the metal compound film, and forming an electrode on the metal-containing insulating film.

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The Notification of Reasons for Rejection mailed Oct. 16, 2007, from the Japanese Patent Office in counterpart Japanese Application No. 11-267207.

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