Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-12-29
2008-11-18
Lindsay, Jr., Walter L (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S528000, C257SE21640
Reexamination Certificate
active
07452780
ABSTRACT:
A method of forming a transistor includes: forming a gate oxide layer and a gate polysilicon layer on a silicon substrate; forming low-energy ion implantation regions in the silicon substrate and in alignment with both sidewalls of the gate polysilicon layer; forming gate spacers on both sidewalls of the gate polysilicon layer; forming amorphous layers on surfaces of the gate polysilicon layer and the silicon substrate by implanting impurities at a low implantation energy into the gate polysilicon layer and the silicon substrate; and forming high-energy ion implantation regions by implanting source/drain impurities at a high implantation energy into the silicon substrate including the gate polysilicon layer and the amorphous layer.
REFERENCES:
patent: 5953616 (1999-09-01), Ahn
patent: 6008098 (1999-12-01), Pramanick et al.
patent: 6013577 (2000-01-01), Kimizuka
patent: 6037204 (2000-03-01), Chang et al.
patent: 6221744 (2001-04-01), Shih et al.
patent: 6335253 (2002-01-01), Chong et al.
patent: 6372591 (2002-04-01), Mineji et al.
patent: 6624037 (2003-09-01), Buynoski et al.
Dongbu Electronics Co. Ltd.
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Lindsay, Jr. Walter L
Patel Reema
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