Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2006-03-27
2008-11-25
Pham, Ly D (Department: 2827)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S149000, C365S185180, C257S302000, C257S330000
Reexamination Certificate
active
07457184
ABSTRACT:
A capacitor structure having a dielectric layer disposed between two conductive electrodes, wherein the dielectric layer contains at least one charge trap site corresponding to a specific energy state. The energy states may be used to distinguish memory states for the capacitor structure, allowing the invention to be used as a memory device. A method of forming the trap cites involves an atomic layer deposition of a material at pre-determined areas in the dielectric layer.
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Basceri Cem
Sandhu Gurtej
Dickstein & Shapiro LLP
Micro)n Technology, Inc.
Pham Ly D
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