Method and system for improving quality of a circuit through...

Details Method and system for improving quality of a circuit through... Method and system for improving quality of a circuit through...

2005-05-09

2008-12-02

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07461315

ABSTRACT:
The present invention is directed to a system and method for quality improvement by identifying test patterns for DFT logic faults and functional logic faults. The identified test patterns may be selectively utilized for pruning of patterns or DPM estimation. Functional faults and DFT faults may be identified from detected TDF faults. The functional faults are faults on a logic which was present in a pre-test insertion net list. Remaining faults are the DFT faults. A set of test patterns for DFT faults may be utilized as the first target for the pattern truncation which will reduce the amount of test patterns to be tested. A set of test patterns for functional may be utilized for improving the TDF coverage.

REFERENCES:
patent: 6247154 (2001-06-01), Bushnell et al.
patent: 6651227 (2003-11-01), Abadir et al.
patent: 6707313 (2004-03-01), Rohrbaugh et al.
patent: 6708139 (2004-03-01), Rearick et al.
patent: 7131081 (2006-10-01), Wang et al.
patent: 7249300 (2007-07-01), Chung et al.
patent: 2005/0138509 (2005-06-01), Kiryu et al.
patent: 2005/0240887 (2005-10-01), Rajski et al.

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