Semiconductor devices and methods of fabricating the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S314000, C257S315000, C257S316000, C257S317000, C257S318000, C257S319000

Reexamination Certificate

active

07442988

ABSTRACT:
Disclosed is a semiconductor device and method of fabricating the same. The device is disposed on a substrate, including a fin constructed with first and second sidewalls, a first gate line formed in the pattern of spacer on the first sidewall of the fin, and a second gate line formed in the pattern of spacer on the second sidewall of the fin. First and second impurity regions are disposed in the fin. The first and second impurity regions are isolated from each other and define a channel region in the fin between the first and second gate lines.

REFERENCES:
patent: 6157060 (2000-12-01), Kerber
patent: 2004/0232471 (2004-11-01), Shukuri
patent: 2004-253571 (2004-09-01), None
patent: 10-0417449 (2004-06-01), None

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