Method for manufacturing semiconductor memory

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S239000, C438S386000, C438S399000, C257S296000, C257SE27084, C257SE27097

Reexamination Certificate

active

07439126

ABSTRACT:
A method for manufacturing a semiconductor memory having a memory cell selection transistor and a capacitor, comprises a step of forming a polysilicon plug having a large-diameter portion on a side of the capacitor, a step of forming a hole reaching the large-diameter portion by etching an insulating film formed on the large-diameter portion using the large-diameter portion as an etching stopper layer, and a step of forming a conductive film inside the hole so as to serve as an electrode for the capacitor.

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patent: 2006/0022241 (2006-02-01), Shimojo et al.
patent: 2000-277711 (2000-10-01), None
patent: 2001-230383 (2001-08-01), None
patent: 2002-076302 (2002-03-01), None

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