Test interface, system, and method for testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S742000

Reexamination Certificate

active

07418639

ABSTRACT:
A test interface is configured to connect to a testing device and a communications device. The communications device may be configured to receive a data signal (that includes a desired data portion) from the test machine. The interface may include a data capture device and a buffer. The data capture device may be configured to receive a framing pulse signal from the communications device, to receive a framing pulse enable signal from the testing device, and to generate a reset signal in response to receiving the framing pulse signal and the framing pulse enable signal. The buffer may be configured to store the data signal from the communications device, and to clear all stored data in the buffer and store the desired data portion in response to receiving the reset signal.

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Udaya N. Shankar, Test Challenges for SONET/SDH Physical Layer OC3 Devices and Beyond, Oct. 28, 2001, Publication ITC International Test Conference IEEE.
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Udaya N. Shankar; Test Challenges For Sonet/SDH Physical Layer OC3 Devices and Beyond; Publication ITC International Test Conference IEEE Oct. 28, 2001.

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