Scan string segmentation for digital test compression

Details Scan string segmentation for digital test compression Scan string segmentation for digital test compression

2005-08-23

2008-08-12

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07412636

ABSTRACT:
One may use a new technique to determine the placement of exclusive-ors in each scan string of a chip may achieve improved test vector compression, and one may combine this technique with methods to minimize the overhead of the exclusive-or logic, to eliminate clock enable logic for multiple scan strings, to minimize the changes to existing test logic insertion and scan strings reordering, and to minimize the test vector compression computation time.

REFERENCES:
patent: 6378108 (2002-04-01), Schoellkopf
patent: 2005/0216805 (2005-09-01), Guettaf

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