Ion implanted microscale and nanoscale device method

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S690000, C438S738000, C438S743000, C257SE21002

Reexamination Certificate

active

07419917

ABSTRACT:
A method is used for producing nanoscale and microscale devices in a variety of materials, such as silicon dioxide patterned buried films. The method is inexpensive and reliable for making small scale mechanical, optical, or electrical devices and relies upon the implantation of ions into a substrate and subsequent annealing to form a stoichiometric film with the device geometry is defined by the implant energy and dose and so is not limited by the usual process parameters.

REFERENCES:
patent: 5116771 (1992-05-01), Karulkar
patent: 5876187 (1999-03-01), Forster et al.
patent: 6475926 (2002-11-01), Litwin et al.
patent: 6486037 (2002-11-01), Norcott et al.
patent: 2006/0115965 (2006-06-01), Abraham
Bioomstein et al., “Laser-chemical three-dimesional writing for microelectromechanics and application to standard-cell microfluidics”, J. Vac. Sci. Technol. B 10(6), Nov./Dec. 1992, pp. 2671-2674.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Ion implanted microscale and nanoscale device method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Ion implanted microscale and nanoscale device method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ion implanted microscale and nanoscale device method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3988830

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.