Process of forming an electronic device including a...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S584000, C438S589000, C438S153000, C257SE21546

Reexamination Certificate

active

07419866

ABSTRACT:
A process of forming an electronic device can include forming a patterned oxidation-resistant layer over a semiconductor layer that overlies a substrate, and patterning the semiconductor layer to form a semiconductor island. The semiconductor island includes a first surface and a second surface opposite the first surface, and the first surface lies closer to the substrate, as compared to the second surface. The process can also include forming an oxidation-resistant material along a side of the semiconductor island or selectively depositing a semiconductor material along a side of the semiconductor island. The process can further include exposing the patterned oxidation-resistant layer and the semiconductor island to an oxygen-containing ambient, wherein a first portion of the semiconductor island along the first surface is oxidized during exposing the patterned oxidation-resistant layer, the semiconductor island, and the oxidation-resistant material to an oxygen-containing ambient.

REFERENCES:
patent: 5384473 (1995-01-01), Yoshikawa et al.
patent: 6720619 (2004-04-01), Chen et al.
patent: 6867433 (2005-03-01), Yeo et al.
patent: 6909147 (2005-06-01), Aller et al.
patent: 6911383 (2005-06-01), Doris et al.
patent: 2004/0031979 (2004-02-01), Lochtefeld et al.
patent: 2004/0222477 (2004-11-01), Aller et al.
patent: 2004/0259324 (2004-12-01), Brask et al.
patent: 2004/0266076 (2004-12-01), Doris et al.
patent: 2005/0023633 (2005-02-01), Yeo et al.
patent: 2005/0116289 (2005-06-01), Boyd et al.
patent: 2005/0118826 (2005-06-01), Boyd et al.
patent: 2005/0181612 (2005-08-01), Brask et al.
patent: 2005/0275018 (2005-12-01), Venkatesan et al.
patent: 2006/0160294 (2006-07-01), Cheng et al.
patent: 1 519 421 (2005-03-01), None
Yang et al., “On the Integration of CMOS with Hybrid Crystal Orientations,” IBM Semiconductor Research and Development Center, 2004 Symposium on VLSI Technology Digest of Technical Papers, 2004 IEEE, pp. 160-161.
Doris et al., “A Simplfied Hybrid Orientation Technology (SHOT) for High Performance CMOS,” IBM Semiconductor Research and Development Center, 2004 Symposium on VLSI Technology Digest of Technical Papers, 2004 IEEE, pp. 86-87.
U.S. Appl. No. 11/328,668, entitled: Process for Forming an Electronic Device Including a Fin-Type Structure, filed Jan. 10, 2006.
U.S. Appl. No. 11/337,355, entitled: Electronic Device Including a Static-Random-Access Memory Cell and A Process of Forming the Electronic Device, filed Jan. 23, 2006.
U.S. Appl. No. 11/375,890, entitled: Electronic Device Including a Semiconductor Fin and a Process for Forming the Electronic Device, filed Mar. 15, 2006.
Actions on the Merits by the U.S.P.T.O. as of Nov. 28, 2007, 1 page.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process of forming an electronic device including a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process of forming an electronic device including a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process of forming an electronic device including a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3979115

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.