Setting method of chip initial state

Static information storage and retrieval – Read/write circuit – Bad bit

Reexamination Certificate

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C365S185090, C365S225700

Reexamination Certificate

active

07397714

ABSTRACT:
Fuse data is supplied to each of a plurality of function blocks through a transfer path using shift registers. When the reliability of fuse elements is low, there is a possibility that a part of the fuse data may have an error. Further, when the transfer path of the fuse data is long, there is a possibility that a value of the fuse data may be inverted due to an influence of noises. Thus, a decoder is arranged in the transfer path of the fuse data, and encoded data is stored in the fuse elements. By performing error detection/correction in the decoder, the high reliability is assured with respect to chip operations and the like.

REFERENCES:
patent: 4506385 (1985-03-01), Fedde et al.
patent: 6009040 (1999-12-01), Choi et al.
patent: 6577534 (2003-06-01), Tsuruda
patent: 6654286 (2003-11-01), Kawakami
patent: 6684345 (2004-01-01), Harari et al.
patent: 7069493 (2006-06-01), Takahashi et al.
patent: 2003/0086306 (2003-05-01), Takahashi et al.
patent: 2007/0195575 (2007-08-01), Nagai et al.
patent: 2001-358313 (2001-12-01), None
patent: 2002-133895 (2002-05-01), None
patent: 2003-233999 (2003-08-01), None
Michael R. Ouellette, et al., “Shared Fuse Macro For Multiple Embedded Memory Devices With Redundancy”, IEEE 2001 Custom Integrated Circuits Conference, 2001, pp. 191-194.
T.C. May, et al., IEEE Transactions On Electron Devices, vol. ED-26, No. 1, pp. 2-9, “Alpha-Particle-Induced Soft Errors in Dynamic Memories”, Jan. 1979.
J.F. Ziegler, et al., IEEE Journal of Solid-State Circuits, vol. 33, No. 2, pp. 246-252, “Cosmic Ray Soft Error Rates of 16-MB DRAM Memory Chips”, Feb. 1998.

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