Method of manufacturing dielectric film of flash memory device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S258000, C438S597000, C438S508000, C438S508000

Reexamination Certificate

active

07393744

ABSTRACT:
A method of manufacturing a dielectric film of a flash memory device, including the steps of providing a semiconductor substrate having floating gates formed therein, performing an oxidization process in a decompression state to form a first oxide film of a thin film on the semiconductor substrate including the floating gates, and sequentially forming a nitride film and a second oxide film on the first oxide film to form a dielectric film having the first oxide film, the nitride film and the second oxide film.

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patent: 2004/0005767 (2004-01-01), Dong
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patent: 2005/0186736 (2005-08-01), Joo
patent: 2005/0266640 (2005-12-01), You et al.
patent: 2004-0046512 (2004-06-01), None
patent: 2004/0101927 (2004-12-01), None
patent: 2005/0004077 (2005-01-01), None

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