Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-12-15
2008-07-08
Dickey, Thomas (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE51004
Reexamination Certificate
active
07397080
ABSTRACT:
A non-volatile memory including at least a substrate, a memory cell and source/drain regions is provided. The memory cell is disposed on the substrate and includes at least a first memory unit and a second memory unit. Wherein, the first memory unit, from the substrate up, includes a floating gate and a first control gate. The second memory unit is disposed on a sidewall of the first memory unit and includes a charge trapping layer and a second control gate. The two source/drain regions are disposed in the substrate at both sides of the memory cell.
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Wong Wei-Zhe
Yang Ching-Sung
Dickey Thomas
Jianq Chyun IP Office
Mandala Jr. Victor A.
Powerchip Semiconductor Corp.
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