Photosensitive composition and method for forming pattern...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface

Reexamination Certificate

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C430S330000, C430S270100, C430S905000, C430S910000

Reexamination Certificate

active

07338755

ABSTRACT:
The photosensitive composition of the invention contains a polymer material having a group having a structure represented by following general formula (2), and a photo acid generator generating acid with an ultraviolet ray or an ionizing radiationwherein m represents an integer of 0 or more.

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patent: 2004-333548 (2004-11-01), None
patent: 2004-333549 (2004-11-01), None
Takuma Hojo, et al., “Recent Progress in New Acetal-based Resist for Electron Beam Lithography”, Journal of Photopolymer Science and Technolgoy, vol. 16, No. 3, 2003, pp. 455-458.

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