Measuring microprocessor susceptibility to internal noise...

Details Measuring microprocessor susceptibility to internal noise... Measuring microprocessor susceptibility to internal noise...

2007-12-25

2007-12-25

Mis, David (Department: 2817)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

11388002

ABSTRACT:
A computer implemented method, testing system, computer usable program code, and apparatus are provided for measuring microprocessor susceptibility to internal noise A noise generator modulates a clock signal to generate noise on a targeted component within a microprocessor. A function generator executes microprocessor functions on a plurality of functional components within the microprocessor. A maximum execution frequency on the plurality of functional components is then measured and a set of frequency ranges where the functional components are susceptible to the generated noise is determined.

REFERENCES:
patent: 5499250 (1996-03-01), Ingalls et al.
patent: 2003/0151464 (2003-08-01), Gauthier et al.
patent: 2003/0154453 (2003-08-01), Gauthier et al.

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