Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2007-08-07

2007-08-07

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000

Reexamination Certificate

active

10894089

ABSTRACT:
A semiconductor integrated circuit includes: a logic circuit to be tested; a memory connected the logic circuit to be tested; a BIST circuit for testing the memory; and a bypass circuit connected between the memory and the logic circuit and between the memory and the BIST circuit, the bypass circuit has a parallel test path for testing the logic circuit and the memory in parallel, and a signal line test path for testing non-tested signal lines in the parallel test path, and the bypass circuit selectively switches the parallel test path and the signal line test path.

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