Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2007-09-25
2007-09-25
Lee, Hsien-Ming (Department: 2823)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C438S785000, C438S787000, C438S791000
Reexamination Certificate
active
11038324
ABSTRACT:
Methods and apparatus are provided for forming thin films for semiconductor devices, which enable supplying and removing reactants containing constituent elements of a thin film to be formed, by preheating and supplying a process gas and a purging gas at a predetermined temperature in forming the thin film on a substrate. For example, a method for forming a thin film includes supplying a first reactant to a chamber to chemically adsorb the first reactant onto a substrate, the first reactant being bubbled by a first gas that is preheated, purging the chamber to remove residues on the substrate having the first reactant chemically adsorbed, and forming the thin film by a means of chemical displacement by supplying a second reactant to the chamber to chemically adsorb the second reactant onto the substrate.
REFERENCES:
patent: 6391785 (2002-05-01), Satta et al.
patent: 6620670 (2003-09-01), Song et al.
patent: 7007933 (2006-03-01), Lee et al.
patent: 2003/0003635 (2003-01-01), Paranjpe et al.
patent: 2005/0012975 (2005-01-01), George et al.
Han Jae-Jong
Kim Ki-Chul
Park Young-Wook
Yeo Jae-Hyun
F. Chau & Assoc. LLC
Lee Hsien-Ming
Samsung Electronics Co,. Ltd.
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