Tester system having a multi-purpose memory

Details Tester system having a multi-purpose memory Tester system having a multi-purpose memory

2007-01-30

2007-01-30

Britt, Cynthia (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C324S765010

Reexamination Certificate

active

10435494

ABSTRACT:
An apparatus for testing an integrated circuit, the apparatus including a sequence control logic unit having an output channel connectable to a device under test, and a memory to store at least two types of data sets, each data set being used by the sequence control logic unit to determine a test pattern to output on the output channel.

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International Search Report, International Application No. PCT/US03/14891, Sep. 18, 2003, pp. 1-2.

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