Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-09-18
2007-09-18
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
10908537
ABSTRACT:
Described is a method for automatically generating a wafer prober file whereby testing parameters and die identities can be established for testing a complete semiconductor wafer and whereby acceptable or rejected dies can be identified and correlated later with where the good or bad dies are physically located on a wafer-under-test.
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Chen Edward
Chuang Jumbo
Hsiao Chun-Chieh
Hsu Chang-Chi
Hung Win
Hollington Jermele
Taiwan Semiconductor Manufacturing Company , Ltd.
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