Method of forming a semiconductor device using a silicide...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S299000, C438S304000, C438S581000, C438S596000

Reexamination Certificate

active

10950017

ABSTRACT:
Semiconductor devices and methods for fabricating a silicide of a semiconductor device are disclosed. An illustrated method comprises: forming a gate electrode; depositing an insulating layer; removing a predetermined portion of the insulating layer in order to expose a portion of the gate electrode; forming silicide on the exposed portion of the gate electrode; and etching the insulating layer while using the silicide as an etching mask.

REFERENCES:
patent: 6239007 (2001-05-01), Wu
patent: 6326290 (2001-12-01), Chiu
patent: 6383882 (2002-05-01), Lee et al.
patent: 6534405 (2003-03-01), Wu
patent: 6864178 (2005-03-01), Kim

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming a semiconductor device using a silicide... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming a semiconductor device using a silicide..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a semiconductor device using a silicide... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3725131

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.